基于老化特征的集成电路失效预测与防护

As technology being improved rapidly, aggravating circuit aging has caused a new challenge for the reliability. This research focuses on the problem of failure prediction and protection for circuits. The main research objects are as follows.(1)Aging failure prediction using self-oscillating loop. It selects aging sensitive data paths from circuits，constructs self-oscillating loop for them using their own devices and uses a specific aging signature counter to measure the aging degree and predict circuit failure.(2)Recovering aged circuit by the reusing of self-testing structure. It focuses on the process of reusing self-testing circuits to construct an effective aging recovery mechanism.(3)Adaptive online self-scaling for circuits. It researches on the dynamical method with precisely self-scaling of operating conditions such as supply voltage and clock frequency, according to the aging signatures of circuits.(4)Aging fault tolerance using time-space redundancy method. It researches on the method to correct faults resluting from circuit aging by combining multi-clock technique and redundant circuits. . The research on failure prediction and protection for circuits could effectively extend the life-time and reduce the maintenance cost of electronic production, and it is also meaningful to improve the circuits reliability.

集成电路特征工艺尺寸不断缩小的同时，电路的老化速度也在加剧，严重影响了集成电路的使用寿命和可靠性。本课题以集成电路老化失效预测和防护为切入点，主要研究内容包括：⑴基于自振荡回路的老化失效预测。选择老化敏感的特征通路，利用自身电路构建自振荡回路，通过老化特征计数器捕获老化特征，度量老化程度，预测电路失效。⑵复用自测试电路的老化恢复。利用已有的内建自测试结构生成和施加电路老化恢复向量，实现电路老化的自恢复。⑶电路参数的自适应在线调整。根据电路老化特征值，在线精确调整电路的供电电压和工作频率，保证电路的可靠运行。⑷采用时-空冗余技术的电路老化故障容忍。利用多时钟技术和冗余单元修正老化引起的电路故障，避免电路老化失效的发生。.本研究将有效延长电子产品的生命周期，降低电路的维护成本，提高电路的可靠性，具有很强的理论和应用价值。

本项目主要研究集成电路老化失效预测和防护中若干关键基础问题，在电路老化预测检测、缓解减弱电路老化、防止老化引起电路失效方面取得了创新性成果：.（1）发明一种基于自振荡回路的电路老化测试方法。具有精度高、结构简单、面积开销小和抗干扰性强的特点。.（2）提出一种容忍电路老化的动态自适应方法。基于检测的电路老化程度，自适应调整时钟相位，本方法可以有效提高电路的平均无故障时间（MTTF）。.（3）提出一种利用对称或非门来平衡检测能力的老化预测、检测方案。基于对称式的或非门单元，有效消除由于晶体管串联堆栈引起的误差。.（4）提出一种缓解NBTI和减少泄漏电流的抗老化电路结构。在多米诺电路结构中拉高动态节点和输出节点，并将反相器和保持器的PMOS管切换到恢复模式，可以极大地缓解老化和减少泄漏电流。.（5）提出一种输入控制向量选取方法。用于协同门替换技术缓解NBTI，与现有选取方法相比，可有效改善电路时延退化。.（6）在IEEE Transactions on Nuclear Science、Microelectronics Reliability、Journal of Circuits Systems and Computers、Electronics Letters、Journal of Electronic Testing: Theory and Applications (JETTA)、IEICE Transactions on Electronics、Chinese Journal of Electronics、Design, Automation & Test in Europe Conference & Exhibition (DATE)等国内外著名期刊和会议上共发表学术论文81篇（SCI、EI收录39篇）；授权发明专利 2件；获得2013年安徽省自然科学优秀学术论文三等奖；培养出4位博士和26位硕士。