考虑波动的单粒子双点翻转加固单元设计关键技术研究

With the rapid development of VLSI, high reliable and long life chip is necessary for safety critical application such as aerospace electronics, automotive electronics and medical electronics. So single event hardening cell has become research focus. This NSFC proposal describes a research plan as following. Firstly, this proposal focuses on single event double node upset filtering cell based on dual input inverter. The multiple interconnect feedback scheme can filter the double node upset entirely. The proposed cell is insensitive to high impedance. Secondly, this proposal addresses the single event double node upset blocking cell based on dual modular redundancy. It introduces two single event upset recovery cells and recovers from the wrong logic state quickly. C element at the output can block the fault propagation to the next stage. Thirdly, this proposal implements double node upset hardening cell based on heterogeneous triple modular redundancy. It can avoid common mode failure and recover from single event double node upset quickly. This research will present a solution of single event hardening cell in presence of PVTA variation with high cost performance.

我国集成电路行业快速发展，航天电子、医疗电子、汽车电子等安全关键领域对于高可靠长寿命的芯片需求十分迫切。因此，容忍工艺、电压、温度、老化波动的单粒子加固单元设计成为研究热点。主要内容包括：(1)研究基于双输入反相器的单粒子双点翻转过滤单元。构建多级互联反馈的电路拓扑结构，可以完全过滤单粒子双点翻转，并且对于高阻态不敏感。(2)研究基于同构双模冗余的单粒子双点翻转阻塞单元。在单元内部构建双模冗余的容错机制，两个同构的自恢复单元输出端连接C单元，快速从错误逻辑状态中自行恢复，有效阻塞故障传播到下一级逻辑。(3)研究基于异构三模冗余的单粒子双点翻转加固单元结构，有效容忍共模故障，可以从单粒子双点翻转中快速自行恢复到正确的逻辑状态。本项目将为容忍波动的单粒子双点翻转加固单元设计提供理论方法与关键技术。

我国集成电路行业快速发展，航天电子、医疗电子、汽车电子等安全关键领域对于高可靠长寿命的芯片需求十分迫切。因此，容忍工艺、电压、温度、老化波动的单粒子加固单元设计成为研究热点。.本项目研究考虑波动的单粒子多点翻转加固单元设计关键技术，第一，深入研究纳米尺度下电荷共享诱发单粒子多点翻转的物理机制，进行理论建模和软件仿真，搭建了基于Sentaurus TCAD和HSPICE的跨层次混合仿真平台，在仿真速度和仿真精度之间取得平衡。第二，基于双模冗余和三模冗余的容错加固原理，利用DICE单元的自恢复特性和C单元的阻塞特性，协同使用DICE单元和C单元，提出了一系列晶体管级单粒子翻转加固单元，在加固型存储单元、双沿触发器、阻塞型锁存器、自恢复型锁存器4个方面取得了创新性成果。.在IEEE Transactions on Circuits and Systems、IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems、IEEE Transactions on Aerospace and Electronic Systems、IEEE Transactions on Computers、IEEE Transactions on Very Large Scale Integration (VLSI) Systems、电子学报、电子与信息学报、计算机辅助设计与图形学学报等国内外著名期刊发表学术论文33篇，其中SCI收录25篇，EI收录7篇。授权发明专利6件。培养出15名硕士研究生，2名博士研究生。