宇航用双互锁存储单元单粒子翻转行为及在轨预计建模研究

Dual Interlocked Storage Cells (DICE) are widely used in radiation-hardened designs for SRAM memory cells.However, heavy-ion radiation test datas show that the DICE is not immune for single event upsets. it will directly affect the reliable operation of the spacecraft electronic system, and the risk assessment of single event rates needs to be performed.The new mechanism of single event upsets behaviors in DICE poses a challenge to the old acknowledge that the direct ionization of heavy ions is the only SEU mechanism and the conventional SER prediction method based on a single sensitive volume model.This project will focus on the single event upsets mechanism of DICE units for aerospace , and explore the mechanism under direct action of particles such as direct ionization, Coulomb scattering, and nuclear reaction.This project will study the correlation of the rate contribution of each mechanism with the incident ion conditions and the distance of sensitive nodes, and make efforts to explore the differences in the mechanism of space and particle accelerator; and estimate the SER prediction model in-orbit expected for DICE reinforcement devices.

双互锁存储单元（Dual Interlocked storage Cell，DICE）广泛用于SRAM存储单元的抗辐射加固设计。但重离子单粒子试验数据表明DICE加固设计单元仍然会发生单粒子翻转现象。在宇航在轨应用中将直接影响航天器电子系统的可靠运行，需要进行在轨单粒子翻转率的风险评估。而DICE加固设计结构带来的单粒子效应新机制，对目前主要考虑的重离子直接电离导致单粒子翻转机制，以及传统基于单一敏感体积模型的在轨预计方法提出了挑战。本项目将以宇航用双互锁存储单元单粒子翻转行为机制为研究对象，探索直接电离、库伦散射反冲核、核反应次级粒子等粒子作用过程下的翻转机理；研究各机制的翻转率贡献与入射离子条件和敏感节点距离的相关性，着力探索天地翻转机理的差异，充分考虑实际在轨可能的翻转行为；研究适用于DICE加固器件的在轨单粒子翻转预计模型建立方法。

双互锁存储单元（Dual Interlocked storage Cell，DICE）广泛用于SRAM存储单元的抗辐射加固设计。但重离子单粒子试验数据表明DICE加固设计单元仍然会发生单粒子翻转现象。在宇航在轨应用中将直接影响航天器电子系统的可靠运行，需要进行在轨单粒子翻转率的风险评估。而DICE加固设计结构带来的单粒子效应新机制，对目前主要考虑的重离子直接电离导致单粒子翻转机制，以及传统基于单一敏感体积模型的在轨预计方法提出了挑战。本项目以宇航用双互锁存储单元单粒子翻转行为机制为研究对象，探索直接电离、库伦散射反冲核、核反应次级粒子等粒子作用过程下的翻转机理；研究各机制的翻转率贡献与入射离子条件和敏感节点距离的相关性，着力探索天地翻转机理的差异，充分考虑实际在轨可能的翻转行为；研究适用于DICE加固器件的在轨单粒子翻转预计模型建立方法。