电子晶体学图像处理

The electron crystallographic imageprocessing techniques built up by the present group has been improved and applied to crystal structure and defect determination as described in the following:(1).Crystal structure determination for the high-temperature superconductor 'Pb'-2212(2)Determination of position of doped B atoms in Y-based high-temperature superconductor(3)Images deconvolution and phase extension for simulated high-resolution electron microscope images of protein straptavidin.(4)Distinguishing the shuffle and glide types 60o dislocation in Si, between which the difference is only in a single atom.(5)Determination of core structure of Lomer dislocation in GeSi/Si epilayer(6)Image deconvolution for simulated image of defected crystal GaN

进一步完善发展申请人等近年建立的电子晶体学图像处理方法，并应用于有特殊物理性能的凝聚态微小晶体和蛋白质晶体结构测定。与过去相比，侧重于图像处理方法在场发射高分辨电子显微学中的发展和应用，以及改进方法，使之运用于蛋白质晶体晶胞大的特点及其不同于固体材料的成像条件，发展电子晶体学，为相关学科提供其它方法所得不到的结构资料。