基于双图像探测器的毫秒级小型角位移测量技术及误差补偿方法研究

With the development of science and technology, photoelectric encoder is becoming smaller in size, with higher resolution and lighter weight. To Achieve high resolution and accuracy, whereas reduce the size of the encoder has been the hotspot currently. The applicant of this program has noticed by early state research that traditional coding by dual photoelectric detecting is not capable of achieving higher resolution; adopting technology of photoelectric and digital photo processing has great advantage over traditional methods for the purpose of improving the resolution of the angle measurement. This program focuses on photographic encoder, adopting a diameter collecting method, to achieve high-resolution angle measurement and error calibration. The main contexts of the research include: research about the establishment of displacement coding of grating and its corresponding high-resolution subdivision; research about the establishment of error model of subdivision and its error calibration work. The objective of the program is to achieve high-resolution angle measurement and error calibrate algorithm with smaller grating plate, which will lay theoretical and technological foundation for small high-resolution photographic rotary encoder.

随着科学技术发展，光电编码器正向高精度、高分辨力、体积小型化、重量轻量化方向发展。采用小尺寸码盘实现高分辨力、高精度的角位移测量是目前的研究热点。项目申请人在前期的研究中发现，受码盘尺寸和刻划精度的影响，采用传统光电对射管设计的光电编码器不能够实现更高的分辨力；使用图像传感器和数字图像处理技术代替传统光电对射探测方法，在提高测角分辨力的研究中有着明显的优势。本项目以图像式光电编码器为研究对象，研究采用对径图像采集方法实现高分辨力轴角测量的技术及其误差补偿的方法。研究内容包括：基于图像探测器快速信息提取的单圈高分辨力编码方式的研究；码盘图像位移模型的建立及高分辨率细分算法的研究；细分误差模型建立与误差补偿算法研究。本项目旨在明确小尺寸码盘实现高分辨力角度测量的技术及其误差补偿方法，为小型高分辨力图像式轴角编码器的研制奠定理论与技术基础。

随着科学技术发展，角位移测量技术正向高精度、高分辨力、体积小型化、重量轻量化方向发展。为提高小型角位移测量技术的分辨力和精度，本项目提出采用图像探测器实现高分辨力、高精度角位移测量的方法，并开展了研究。研究取得的进展如下：建立了单圈绝对式标定光栅编码方式及识别体系，突破现有测角技术中小尺寸码盘不易实现高位编码的局限，改善了图像式测量频率响应慢的技术缺陷；提出了高分辨力亚像素级角度细分算法，突破了现有技术细分倍数小、分辨力低的局限；建立图像式角位移测量的误差模型，为图像式角位移测量的误差补偿探明了道路。经过实验，采用外径38mm的圆光栅实现了0.15"(23位)的测角分辨力和6.33"的测角精度，测量性能高于同尺寸的传统小型角位移测量装置。本项目的研究，探明了单圈绝对式编码方式，明确了图像式编码器高分辨力角度细分方法，揭示有效的角位移误差补偿方法，为小型高分辨力图像式轴角位移测量技术奠定了理论与技术基础。