各向异性非匀质样品的扫描X射线小角散射成像方法研究

The material properties of anisotropic samples are highly dependent on their microstructure and orientation. The nanostructures characterization is crucial for fundamental understanding, fabrication and application of high-performance materials. Scanning SAXS has an advantage in the nanostructure characterization of large scale samples in high resolution. To overcome the limitation of the applicable range of the existing technique, this project aims to study Scanning SAXS imaging method for the anisotropic inhomogeneous sample: The typical strongly scattering samples, X-ray resist microfluidics chip as a sample container are selected; the experimental setup based on the synchrotron X-ray source for scanning SAXS measurements will be established. The modeling of nanostructure and the 2D data analysis algorithm and imaging will be investigated. Based on the model with a series of spherical harmonics function, the 3D reconstruction algorithm obtaining nanostructure and orientation information will be researched. A new visualization method of nanostructure distribution will be developed. Finally, the characterization and 2D/3D imaging of the nanoscale structure of anisotropic materials in microfluidic system can be realized. It is anticipated to providing a new means for tracking the evolution of sample orientation and structure, dynamic behavior, function mechanism, which may be extended to broader samples for their nondestructive nanostructure characterization.

各向异性材料的微观结构与取向往往显著影响其宏观性能，有效表征纳米结构分布信息是理解、构筑和应用高性能新材料的关键。Scanning SAXS前沿技术具有能在大尺度范围内表征样品高分辨纳米尺度信息的优势，针对现有技术在表征各向异性非匀质样品的适用范围上存在局限，本项目拟研究各向异性非匀质样品的Scanning SAXS成像方法：选取强散射典型样品，以微流控芯片为样品载体，依托同步辐射科学装置搭建实验平台，进行纳米结构模型构建和二维数据解析算法与成像研究，并在此基础上进行基于球面调和函数的纳米结构和取向信息的三维重构算法研究，发展图形可视化的样品纳米结构表征成像新方法。最终实现微流控体系下各向异性材料纳米尺度结构分布的有效表征与二维/三维成像。预期成果能为追踪样品内部、取向及动态结构变化行为、功能机制提供新手段，以期拓展应用到更广泛的各向异性非匀质样品的无损超微结构表征。

本项目开展各向异性非匀质样品的Scanning SAXS成像方法研究，前期在同步辐射光源进行了装置系统搭建，以纳米结构非匀质的鱿鱼牙齿、纤维等样品为例，进行实验数据扫描同步采集，研究了纳米结构的建模、二维数据分析算法和成像方法, 提出了基于纳米结构和方向信息的二维/三维重建算法。最后发展出的一种新的纳米结构分布可视化方法，实现了大视场、高分辨率各向异性材料纳米结构的二维/三维成像。建立国际前沿的材料结构表征技术X射线扫描小角散射成像（Scanning SAXS）成果能为追踪样品内部、取向及动态结构变化行为、功能机制提供新手段，以期拓展应用到更广泛的各向异性非匀质样品的无损超微结构表征。实验装置已在上海光源安装并测试验证，成像方法可以为用户开放使用。