空间单粒子效应和充放电效应诱发星用存储器件“软错误”的异同规律及机理研究

Many spacecraft anomalies were introduced by space environments, among them single event effects (SEE) and space electrostatic discharge (SESD) resulting from spacecraft charging，both due to influence of space charged particles on spacecraft, are two major causes.Although SEE and SESD have been investigated separately for decades,spacecraft anomalies ignited by these two means show some common points in many cases,such as they often introduced by recoverable “soft errors” on devices onboard spacecrafts.Meanwhile, the details and countermeasures for these two kinds of “soft error” are not simply same.Worse still,the “soft errors” caused by SEE and SESD are confusing spacrcart engineers heavily in recent years. However, it is pity that untill now the two outstanding space charged particles influence are studied and applied independently, the possible relevance between them is not kown. Just in this situation,this proposal selecting SRAM devices as representative samples, will study appearance characteristic of the “soft error”, relevance to impact method and condition for the devices and the mechanisms, investigate relation with disturbing source of SEE and SESD as well as the mechanisms. In general, it is desired that some common rules and mechanisms for sameness and difference between “soft error” in SRAM introduced by SEE and SESD can be disclosed.

空间环境的作用导致了较多的航天器异常，其中绝大多数是空间带电粒子通过单粒子效应和充放电效应所致，长期以来学术界和工程界将此二者视为两个相对独立的问题。但是，在具体的航天实践中，此二者诱发的航天器异常均大量地表现为卫星用器件电路产生了“软错误”，即它们对航天器的宏观影响似乎有某种关联性，但影响的具体细节及防护设计又不是简单的完全相同，这引起了越来越多的混淆。遗憾的是，由于多种原因所限，截至目前人们一直将单粒子效应和充放电效应分割开来研究和应用，鲜有综合比对研究以揭示二者诱发“软错误”异同的，这影响了人类对空间带电粒子与航天器作用及影响的准确认知及工程应用。本课题建议以静态随机存储器件（SRAM）为典型对象，首次比较研究单粒子效应和充放电效应导致的“软错误”表现特征、与器件被作用途径和方式的关系及机理、与干扰源特性的关联性及机理，尝试揭示二者诱发的存储器件“软错误”的异同规律及机理。

国内外航天实践表明，空间环境的作用导致航天器产生了较多的异常或故障。在很多情形下二者诱发的航天器异常都表现为电子设备出现数据或逻辑状态跳变、工作模式非受控地切换、逻辑运行或执行操作异常等“软错误”。但是关于空间带电粒子触发的单粒子效应和充放电触发的“软错误”的异同特征、规律及机理等基础问题，鲜有直接的研究和报道，并不清楚。本工作以典型的存储器件研究对象，利用脉冲激光、重离子加速器、静电发生器和数值模拟仿真软件，从空间单粒子效应和充放电效应导致器件“软错误”的异同表现特征入手，对这两类“不同”物理现象进行综合比对实验及仿真研究，揭示“软错误”与器件被作用方式和途径的关系及机理、与空间高能粒子和空间充放电脉冲的特性的关联性规律及机理，深化和丰富人类对空间带电粒子与航天器作用及影响的科学知识，为航天工程相关技术的发展进步奠定科学理论基础。