低能离子注入作物种子胚内的射程分布

110keV 56Fe+1 ions with 5×1016ions/cm2 were used to perpendicularly implant into embryo of spring wheat seeds. The embryo face was broken with fingers into two sections. Electron beams generated by EMS hit the embryo along depth. Intensity of characteristic X-rays from Fe atoms was measured. Distribution of Fe ions with depth was obtained. Result demonstrated that maximum depth of the ions is about 5μm and 0.935μm at peak. The result is basically consistent with previous ones in several methods, but more different from ones of somebody. The result calculated by LSS formula is minimum. It indicates that the calculation program should be recompiled or made a more correction for calculation of range distribution of ion implantation in bio-medium. The result also indicates that induced mutation of seeds is not direct action of the ions themselves and results from some secondary effects caused by ion implantation.

采用Ke-40低能放射性P-32离子，以不同剂量注入作物种子。测定在大、小剂量情况下对离由涑痰挠跋欤胱由涑谭植妓孀⑷牒罄淙词奔涞谋浠＝⒆⑷肜胱釉谧魑镏肿幽诜植嫉氖Ｐ停栉锢砻枋觥Ｕ舛岳斫獾湍芾胱印俺ど涑獭毙вΦ幕怼⑽湍芾胱幼⑷胱魑镉毡溆值挠τ锰峁├砺鄹荩哂兄匾庖濉?.