基于离焦和相移编码的复杂暗表面快速、高精度三维测量的研究

The precision three-dimensional measurement of complex surface is very important in industrial Non-destructive testing. The binary fringe defocused projection method has important application prospect in fast-speed three-dimensional measurement ,but it can hardly implement high-accuracy three-dimensional measurement of complex surface.Therefore, this project plans to study the key technology of complex surface three-dimensional measurement based on the binary and the phase coding fringes defocused projection.With the frequency of the phase coding fringe increasing when defocused projection,the judgement of the fringe order becomes difficult, the fringe order is prone to error in jump area and the cycle dislocation problem becomes more serious,which lead to the phase unwrapping error. This project attempts to propose the principle of the phase shift coding method to solve the mentioned problems. Exploring the principle of phase coding fringe based on phase shift coding method,which decreases the frequency of the phase coding fringe and makes the judgement of the fringe order accurate. Exploring the correction method of the fringe order and cycle dislocation based on the principle of phase shift coding.And studing the complex surface three-dimensional measurement in different brightness by experiments. Through the research of this project,it can resolve the phase unwrapping problem of the complex surface three-dimensional measurement based on the binary and the phase coding fringes defocused projection, and realize high-accuracy three-dimensional measurement of complex surface in different brightness.The achievements can lay the theoretical foundation for the binary fringe defocused projection in the widely application of fast-speed and high-accuracy three-dimensional measurement of products with dark complex surface.

复杂表面的精密三维测量在工业无损检测中非常重要。二进制条纹离焦投影方法在快速三维测量中有重要的应用前景,但该方法难以实现复杂表面高精度三维测量。为此，本项目拟对基于二进制条纹加相位编码条纹离焦投影的复杂表面三维测量关键技术开展研究。针对离焦投影时，随着相位编码条纹频率增大,条纹级次判决变得困难、跳变处易出错以及周期错位等问题而导致相位解包裹出错，本项目试图提出相移编码方法的原理来解决以上问题。探索基于相移编码方法的相位编码条纹的原理，降低相位编码条纹频率，使条纹级次判决准确；探索基于相移编码原理的条纹级次和周期错位校正方法；并进行各种明暗程度的复杂表面三维测量实验。通过本项目研究，可望解决基于二进制条纹加相位编码条纹离焦投影的复杂表面三维测量的相位解包裹问题，实现各种明暗程度的复杂表面高精度三维测量。为二进制条纹离焦投影方法在复杂暗表面工业产品快速、高精度三维测量的广泛应应用奠定理论基础。

复杂表面的精密三维测量在工业无损检测中非常重要。二进制条纹离焦投影方法在快速三维测量中有重要的应用前景,但该方法难以实现复杂表面高精度三维测量。在工业应用中，常常需要测量不同明暗程度表面的三维形貌，这类表面难以用基于强度的三维测量方法，往往要采用基于相位的方法。为此，本项目对基于二进制条纹加相位编码条纹离焦投影的复杂表面三维测量关键技术开展了研究。针对离焦投影时，随着相位编码条纹频率增大,条纹级次判决变得困难、跳变处易出错以及周期错位等问题而导致相位解包裹出错，本项目提出了相移编码方法的原理来解决以上问题。探索了基于相移编码方法的相位编码条纹的原理，降低了相位编码条纹频率，使条纹级次判决准确；探索了基于相移编码原理的条纹级次和周期错位校正方法；并进行了各种明暗程度的复杂表面三维测量实验研究。通过本项目研究，圆满解决了基于二进制条纹加相位编码条纹离焦投影的复杂表面三维测量的相位解包裹问题，实现了各种明暗程度的复杂表面高精度三维测量。为二进制条纹离焦投影方法在复杂暗表面工业产品快速、高精度三维测量的广泛应应用奠定理论基础。在工业三维测量中具有重要意义和广泛的应用前景。