基于PoF的开关电源全寿命周期质量波动建模及稳健设计研究

Dispersibility is the bottleneck for improving the performance and quality of switching power supply (SPS), also is the main cause of the difference between SPS made in China and abroad. This project based on Physics-of-Failure (PoF), proposes a new life cycle quality modeling method for SPS. The uncertainty theory is combined with multi-physics coupling analysis method. By studying the probability and non-probability features of the three fluctuation factors (manufacturing dispersity, degradation randomness, load fluctuation), a model that can describe the life cycle dynamic quality characteristic of SPS is built. By using the model, this project will analyze the nonlinear relationship between the quality of SPS and its parameters such as the central value of the component parameters, the precision and position information of the components and so on, and then work out the key factors that can influence the robustness of the quality of SPS strongly. The optimization method for these factors is also studied. This project will focus on the mutual basic problems of electric system, the quality model and robust analysis method that will be researched is very important to the quality and reliability of electric system, therefore has important scientific significance and practical value.

分散性是制约开关电源性能与质量提升的瓶颈问题，也是导致国内外电源产品差距的主要原因。本项目基于退化失效物理(PoF, Physics-of-Failure)，提出一种新的构建开关电源全寿命周期质量模型的方法，即在开关电源多物理场耦合分析的基础上，引入不确定性定量描述理论，通过研究加工分散性、退化随机性、载荷波动等三种波动因素的概率与非概率特征及其描述方法，得到可定量表征开关电源全寿命周期动态质量波动的数学模型。在此基础上，分析元器件参数中心值、精度及相对位置关系等下位特性参数对于开关电源质量的非线性效应，并通过虚拟样本构造、试验设计、贡献率分析等过程，研究影响开关电源质量稳健性（即抗分散性能力）的关键因素及其优化方法。本项目所研究的是电子系统的共性基础问题，拟建立的质量波动模型以及基于此提出的质量稳健性分析与设计方法对于提高开关电源等电子系统的质量与可靠性具有重要的科学意义与实用价值。

分散性是制约开关电源性能与质量提升的瓶颈问题，也是导致国内外电源产品差距的主要原因。本项目针对开关电源存在的分散性问题，开展了深入研究，并取得了许多成果。第一，构建了基于PoF的功率半导体器件和铝电解电容性能退化模型；第二，在开关电源多物理场耦合分析的基础上，引入不确定性定量描述理论，研究了融合随机变量和模糊数的多源不确定性模型求解方法；第三，建立了开关电源全寿命周期质量特性描述模型，并通过空间采样与映射，实现了开关电源多输入输出非线性关系的快速计算；第四，研究了开关电源全寿命周期成本量化描述方法，研究了基于Pareto的开关电源多目标稳健性优化设计建模方法。本项目所研究的是电子系统的共性基础问题，建立的质量波动模型以及基于此提出的质量稳健性分析与设计方法对于提高开关电源等电子系统的质量与可靠性具有重要的科学意义与实用价值。在本项目的资助下，项目组在IEEE Transactions on Industrial Electronics、Microelectronics Reliability、IEEE Transactions on Magnetics等多个国际顶尖学术期刊发表学术论文13篇。项目组成员积极参与国内外学术交流，参与了RAMS、QR2MSE、ICREP&EC等顶级国际会议。