动态快速IV测试技术研究

The fast pulsed IV test is an important method to characterize state-of-art photoelectron devices, providing minimum test stress. In some applications, for example, RTN noise characterization of the CMOS sensors, both the test speed and the accuracy are crucial. In the high accuracy pulsed IV test system today, the sampling system must wait until the detection amplifier highly stabilized, as an effect, the test pulse cannot be short enough..The project proposed the Dynamic Fast IV test system to deal with conflicts between the test speed and accuracy. In the system, the steady value prediction technique will be employed to estimate the final level from the changing waveform of the detection amplifier output, thus shorten the test pulse. Since the time delay of the detecting amplifier will increase significantly as the sensitivity increase, this method will be effective, especially for weak signal IV characterization.

快速脉冲IV测试可在极短的应力条件下完成器件参数提取，是新型光电子器件与其他半导体器件可靠性评估的重要手段。一些应用，如CMOS-sensor需要对RTN噪声信号提取，对测量速度和精度均有较高要求。目前的高精度脉冲IV测试系统必须在激励信号稳定后等待检测放大器稳定到较高的精度后采样。测试速度与精度的矛盾突出。.本项目提出了动态快速IV测试技术，拟采用稳定值预测方法利用放大器稳定过程的波形预测最后的稳定值，降低测试脉冲宽度。由于检测放大器的响应时间随检测量程变小而迅速增加，该方法尤其对弱信号的快速检测具有重要意义。

本项目提出了动态快速IV测试技术，采用改进的抛物线差值算法，实现了任意测试信号波形的波表压缩，采用小数-时间变换技术精确控制激励信号的时延，采用稳定值预测方法利用放大器稳定过程的波形预测最后的稳定值，降低测试脉冲宽度，解决了测试速度与精度的矛盾突出。在新型光电子器件与其他半导体测试中有广泛的应用。